Microelectronic package debug access ports

ABSTRACT

A microelectronic package may be fabricated with debug access ports formed either at a side or at a bottom of the microelectronic package. In one embodiment, the debug access ports may be formed within an encapsulation material proximate the microelectronic package side. In another embodiment, the debug access ports may be formed in a microelectronic interposer of the microelectronic package proximate the microelectronic package side. In a further embodiment, the debug access ports may be formed at the microelectronic package bottom and may include a solder contact.

TECHNICAL FIELD

Embodiments of the present description generally relate to the field offabricating microelectronic packages, and, more particularly, to debugaccess ports formed in or on the microelectronic package.

BACKGROUND

The microelectronic industry is continually striving to produce everfaster and smaller microelectronic packages for use in variouselectronic products, including, but not limited to, computer serverproducts and portable products, such as portable computers, electronictablets, cellular phones, digital cameras, and the like. One way toachieve these goals is to fabricate System-In-Package (SIP)microelectronic packages wherein an entire electronic system is formedin a single microelectronic package, which may include processors,application specific integrated circuit (ASIC) devices, volatile memory,non-volatile memory, power systems, wireless communication devices, andthe like. Such SIP microelectronic packages are generally attached to amicroelectronic substrate, such as a motherboard, with interconnects,such as solder balls, in a flip-chip configuration. As themicroelectronic devices within the microelectronic package are fullyencapsulated, there is no way to access internal circuitry within themicroelectronic devices for debugging purposes except through theinterconnects. However, once the microelectronic package is attached tothe motherboard, the interconnects are no longer accessible fordebugging purposes. One option for debugging would be to fabricate probepoints on the microelectronic substrate, such as a motherboard. Thiswould be undesirable for various reasons, including taking up valuablespace on the microelectronic substrate, thereby hampering the drive toreduce the size of electronic products. Another option for debuggingwould be to remove or desolder the microelectronic package from themotherboard and test the failed microelectronic package on a dedicateddebug board. However, three issues arise with desoldering. First,initial debug requires the preservation of the electrical state of themicroelectronic package, which will be lost through desoldering and,thus, valuable data is lost. Second, the microelectronic packages have alimited number attachment, desoldering, and reworking processes thatthey can go through before becoming non-functional, as will beunderstood to those skilled in the art. Third, debugging sometimes needsto be done in the field at a customer's site where desoldering is notpossible. Therefore, it is important to develop ways to debug amicroelectronic package without requiring probe points on themicroelectronic substrate and without requiring the removal of themicroelectronic package from the microelectronic substrate.

BRIEF DESCRIPTION OF THE DRAWINGS

The subject matter of the present disclosure is particularly pointed outand distinctly claimed in the concluding portion of the specification.The foregoing and other features of the present disclosure will becomemore fully apparent from the following description and appended claims,taken in conjunction with the accompanying drawings. It is understoodthat the accompanying drawings depict only several embodiments inaccordance with the present disclosure and are, therefore, not to beconsidered limiting of its scope. The disclosure will be described withadditional specificity and detail through use of the accompanyingdrawings, such that the advantages of the present disclosure can be morereadily ascertained, in which:

FIG. 1 illustrates a cross-sectional view of a microelectronic package,according to an embodiment of the present description.

FIG. 2 illustrates an oblique view of a microelectronic package havingdebug access ports, according to embodiments of the present description.

FIG. 3 illustrates a top view of the adjacent microelectronic packagesprior to dicing, according to embodiments of the present description.

FIG. 4 illustrates a side view along line 4-4 of FIG. 3 after dicing,according to an embodiment of the present description.

FIG. 5 is a flow chart of a process of fabricating a debug access portof a microelectronic package, according to the present description.

FIG. 6 illustrates a computing device in accordance with oneimplementation of the present description.

DESCRIPTION OF EMBODIMENTS

In the following detailed description, reference is made to theaccompanying drawings that show, by way of illustration, specificembodiments in which the claimed subject matter may be practiced. Theseembodiments are described in sufficient detail to enable those skilledin the art to practice the subject matter. It is to be understood thatthe various embodiments, although different, are not necessarilymutually exclusive. For example, a particular feature, structure, orcharacteristic described herein, in connection with one embodiment, maybe implemented within other embodiments without departing from thespirit and scope of the claimed subject matter. References within thisspecification to “one embodiment” or “an embodiment” mean that aparticular feature, structure, or characteristic described in connectionwith the embodiment is included in at least one implementationencompassed within the present description. Therefore, the use of thephrase “one embodiment” or “in an embodiment” does not necessarily referto the same embodiment. In addition, it is to be understood that thelocation or arrangement of individual elements within each disclosedembodiment may be modified without departing from the spirit and scopeof the claimed subject matter. The following detailed description is,therefore, not to be taken in a limiting sense, and the scope of thesubject matter is defined only by the appended claims, appropriatelyinterpreted, along with the full range of equivalents to which theappended claims are entitled. In the drawings, like numerals refer tothe same or similar elements or functionality throughout the severalviews, and that elements depicted therein are not necessarily to scalewith one another, rather individual elements may be enlarged or reducedin order to more easily comprehend the elements in the context of thepresent description.

The terms “over”, “to”, “between” and “on” as used herein may refer to arelative position of one layer with respect to other layers. One layer“over” or “on” another layer or bonded “to” another layer may bedirectly in contact with the other layer or may have one or moreintervening layers. One layer “between” layers may be directly incontact with the layers or may have one or more intervening layers.

Embodiments of the present description include a microelectronic packagefabricated with debug access ports formed either at a side or at abottom of the microelectronic package. In one embodiment, the debugaccess ports may be formed within an encapsulation material proximatethe microelectronic package side. In another embodiment, the debugaccess ports may be formed in a microelectronic interposer of themicroelectronic package proximate the microelectronic package side. In afurther embodiment, the debug access ports may be formed at themicroelectronic package bottom and may include a solder contact.

In the production of microelectronic packages, microelectronic devicesare generally mounted on microelectronic substrates, such asinterposers, which provide electrical communication routes between themicroelectronic devices within the microelectronic package and/or withexternal components. These microelectronic packages are, in turn,attached to a microelectronic substrate, such as a motherboard.

As shown in FIG. 1, a microelectronic package 100 may comprise at leastone microelectronic device 110, such as a microprocessor, a chipset, agraphics device, a wireless device, a memory device, an applicationspecific integrated circuit, combinations thereof, or the like, attachedto a first surface 122 of a microelectronic interposer 120 through aplurality of solder interconnects 142 in a configuration generally knownas a flip-chip or controlled collapse chip connection (“C4”)configuration. The device-to-interposer solder interconnects 142 mayextend from interconnection pads 114 on an active surface 112 of themicroelectronic device 110 and interconnection pads 124 on themicroelectronic interposer first surface 122. The microelectronic deviceinterconnection pads 114 may be in electrical communication withintegrated circuitry 118 (shown generically as a dashed box) within themicroelectronic device 110. The microelectronic interposer 120 mayinclude at least one conductive trace 126 extending therethrough formingconductive path from the microelectronic device 110 to at least onemicroelectronic package interconnection pad 128 on or proximate a secondsurface 132 of the microelectronic interposer 120. The microelectronicinterposer 120 may reroute a fine pitch (center-to-center distancebetween the microelectronic device interconnection pads 114) of themicroelectronic device interconnection pads 114 to a relatively widerpitch of the microelectronic package interconnection pads 128.

It is understood that although FIG. 1 illustrates the microelectronicdevice 110 being connected to the microelectronic interposer 120 withthe device-to-interposer solder interconnects 142 with a flip-chiptechnique, the embodiments of the present description are not solimited, as the microelectronic device 110 may also to be connected tothe microelectronic interposer 120 by any known electrical structure,including, but not limited to, lead frames, bond wires, and the like.

As further shown in FIG. 1, the microelectronic device 110 may beencapsulated with an encapsulation material 150, such as an epoxy. Theencapsulation material 150 may also encapsulate the microelectronicinterposer first surface 122 and extended to at least one side 134 ofthe microelectronic interposer 120 to form an encapsulation materialside 152 that may be substantially planar to the microelectronicinterposer side 134. The microelectronic interposer side 134 and theencapsulation material side 152 comprise a side 160 of themicroelectronic package 100. The microelectronic interposer secondsurface 132 may be proximate an attachment surface 170 of themicroelectronic package 100.

As shown in FIG. 1, the microelectronic interposer conductive traces 126may include at least one debug trace 210, wherein the debug trace 210may form a conductive route from the microelectronic device 110 to themicroelectronic package side 160 (shown on the left hand side of thefigure) and/or the debug trace 210 may form a conductive route from themicroelectronic device 110 to the microelectronic package attachmentsurface 170 (shown on the right hand side of the figure).

The microelectronic package 100 may be attached to a microelectronicsubstrate 180, such as printed circuit board, a motherboard, and thelike, through a plurality of solder interconnects 144. Thepackage-to-substrate solder interconnects 144 may extend between themicroelectronic package interconnection pads 128 and substantiallymirror-image interconnection pads 182 on an attachment surface 184 ofthe microelectronic substrate 180. The microelectronic substrateinterconnection pads 182 may be in electrical communication withconductive routes (shown as dashed lines 186) within the microelectronicsubstrate 180. The microelectronic substrate conductive routes 186 mayprovide electrical communication routes to external components (notshown).

Both the microelectronic interposer 120 and the microelectronicsubstrate 180 may be primarily composed of any appropriate material,including, but not limited to, bismaleimine triazine resin, fireretardant grade 4 material, polyimide materials, liquid crystal polymer,polybenzoxazole, epoxy resin, silica-filled epoxy, glass reinforcedepoxy matrix material, and the like, as well as laminates or multiplelayers thereof. The microelectronic interposer conductive traces 126,including the debug traces 210, and the microelectronic substrateconductive routes 186 may be composed of any conductive material,including but not limited to metals, such as copper, aluminum, gold,silver, nickel, alloys thereof, and the like. The fabrication processesfor the microelectronic interposer 120 and the microelectronic substrate180 are well known in the art and for the sake of brevity andconciseness will not be precisely discussed or further illustratedherein.

The device-to-interposer solder interconnects 142 and thepackage-to-substrate solder interconnects 144 can be made of anyappropriate solder material, including, but not limited to, lead/tinalloys, such as 63% tin/37% lead solder, and high tin content alloys(e.g. 90% or more tin), such as tin/bismuth, eutectic tin/silver,ternary tin/silver/copper, eutectic tin/copper, and similar alloys. Thesolder may be reflowed, either by heat, pressure, and/or sonic energy tosecure the solder between the respective interconnections pads, as willbe understood to those skilled in the art.

FIG. 2 illustrates various configurations of debug access ports groupedas type A, B, and C. In one embodiments, a debug access port A maycomprise the debug trace 210 formed on or in microelectronic interposersecond surface 132. The debug trace 210 may include a contact pad 218,which may be larger than the debug trace 210 to have an appropriatedimension to contact a debug probe (not shown), as will be understood tothose skilled in the art. In a further embodiment, a solder bump 222 maybe formed on the debug trace 210, such as on the contact pad 218 of thedebug trace 210, as shown. As will be understood to those skilled in theart, the solder bump 222 can be latched on with a specifically designedexternal debug probe (not shown).

In another embodiments shown in FIG. 2, a debug access port B maycomprise the debug trace 210 formed within microelectronic interposer120. The debug trace 210 may simply terminate at the microelectronicinterposer side 134, wherein the debug trace 210 may be contacted by anexternal debug probe (not shown). In a further embodiment, as previousdiscussed, the microelectronic interposer 120 may be formed in layers;thus, there may be a plurality of debug traces 210 in a stackedconfiguration relative to the microelectronic interposer first surface122 and the microelectronic interposer second surface 132. In still afurther embodiment, the debug access port B may further include a probecontact 216 that may be formed at the microelectronic interposer side134 and connected to the debug trace 210 (shown in shadow lines). Theprobe contact 216 may be any known microelectronic interposer structure,such as a blind via, a buried via, or a plated through hole. The probecontact 216 may be larger than the debug trace 210 to enable easiercontact with an external debug probe (not shown).

In another embodiments shown in FIGS. 2-4, a debug access port C maycomprise the debug trace 210 formed in or on the microelectronicinterposer first surface 122. The debug trace 210 may simply terminateat the microelectronic interposer side 134, wherein the debug trace 210may be contacted by an external debug probe (not shown). In anotherembodiment, a solder ball or bump 212 may be formed on the debug trace210. As will be understood to those skilled in the art, themicroelectronic package 100 may be formed as a plurality packages (notshown) on a large microelectronic interposer (not shown), whereinindividual microelectronic packages 100 are singulated from otherpackages by cutting material (such as with a wafer saw or with laserablation) between the packages in an area known as a dicing street 240(see FIG. 3). As shown in FIG. 3, which is a top plan view of themicroelectronic package 100 of FIG. 2 (the encapsulation material 150 ofFIG. 2 is not shown for clarity), the debug trace 210 may include anenlarged landing portion 214 to which the solder bump 212 is attached.In one embodiment, a portion of the debug trace 210 and the solder bump212 may be positioned such that half of the solder bump 212 extends intothe dicing street 240; thus, a portion of the debug trace 210 is removedand the solder bump 212 is substantially cut in half during packagesingulation, which will maximize the surface area of the solder bump 212at the microelectronic package side 160 (see FIG. 2), as shown in FIG.4, wherein FIG. 4 illustrates the debug access port C along line 4-4 ofFIG. 3 after singulation. As shown in FIG. 4, the solder bump 212 mayextend into the encapsulation material 150. It is noted that, as shownin FIG. 4, a solder resist material 242 may patterned on themicroelectronic interposer first surface 122 and the debug trace landingportion 214 for the formation of the solder bump 212, as will beunderstood to those skilled in the art.

FIG. 5 is a flow chart of a process 300 of fabricating a microelectronicpackage according to an embodiment of the present description. As setforth in block 302, a microelectronic interposer may be formed having afront surface, an opposing back surface, and at least one side extendingbetween the first surface and the second surface. At least onemicroelectronic device may be attached to the microelectronic interposerfirst surface, as set forth in block 304. As set forth in block 306, anencapsulation material may be disposed over the at least onemicroelectronic device and the microelectronic interposer, wherein theencapsulation material includes at least one side which is substantiallyplanar to at the least one microelectronic interposer side and whereinthe at least one encapsulation material side and the at least onemicroelectronic interposer side comprise a microelectronic package side.At least one debug access port may be formed proximate the least one ofthe microelectronic package side and the microelectronic interposersecond surface, wherein the debug access port is electrically connectedto the at least one microelectronic device, as set forth in block 308.

FIG. 6 illustrates an electronic or computing device 400 in accordancewith one implementation of the present description. The computing device400 houses a board 402. The board may include a number ofmicroelectronic components, including but not limited to a processor404, at least one communication chip 406A, 406B, volatile memory 408(e.g., DRAM), non-volatile memory 410 (e.g., ROM), flash memory 412, agraphics processor or CPU 414, a digital signal processor (not shown), acrypto processor (not shown), a chipset 416, an antenna, a display, adisplay (touchscreen display), a touchscreen controller, a battery, anaudio codec (not shown), a video codec (not shown), a power amplifier(AMP), a global positioning system (GPS) device, a compass, anaccelerometer (not shown), a gyroscope (not shown), a speaker, a camera,and a mass storage device (not shown) (such as hard disk drive, compactdisk (CD), digital versatile disk (DVD), and so forth). Any of themicroelectronic components may be physically and electrically coupled tothe board 402. In some implementations, at least one of themicroelectronic components may be a part of the processor 404.

The communication chip enables wireless communications for the transferof data to and from the computing device. The term “wireless” and itsderivatives may be used to describe circuits, devices, systems, methods,techniques, communications channels, etc., that may communicate datathrough the use of modulated electromagnetic radiation through anon-solid medium. The term does not imply that the associated devices donot contain any wires, although in some embodiments they might not. Thecommunication chip may implement any of a number of wireless standardsor protocols, including but not limited to Wi-Fi (IEEE 802.11 family),WiMAX (IEEE 802.16 family), IEEE 802.20, long term evolution (LTE),Ev-DO, HSPA+, HSDPA+, HSUPA+, EDGE, GSM, GPRS, CDMA, TDMA, DECT,Bluetooth, derivatives thereof, as well as any other wireless protocolsthat are designated as 3G, 4G, 5G, and beyond. The computing device mayinclude a plurality of communication chips. For instance, a firstcommunication chip may be dedicated to shorter range wirelesscommunications such as Wi-Fi and Bluetooth and a second communicationchip may be dedicated to longer range wireless communications such asGPS, EDGE, GPRS, CDMA, WiMAX, LTE, Ev-DO, and others.

The term “processor” may refer to any device or portion of a device thatprocesses electronic data from registers and/or memory to transform thatelectronic data into other electronic data that may be stored inregisters and/or memory.

At least one of the microelectronic components may comprise amicroelectronic device within a microelectronic package, wherein themicroelectronic package may comprise a microelectronic interposer havinga first surface, an opposing second surface, and at least one sideextending between the first surface and the second surface, wherein themicroelectronic interposer second surface comprises a microelectronicpackage attachment surface; at least one microelectronic device attachedto the microelectronic interposer first surface; an encapsulationmaterial disposed over the at least one microelectronic device and themicroelectronic interposer, wherein the encapsulation material includesat least one side which is substantially planar to the at least onemicroelectronic interposer side and wherein the at least oneencapsulation material side and the at least one microelectronicinterposer side comprise a microelectronic package side; and at leastone debug access port formed proximate the least one of themicroelectronic package side and the microelectronic package attachmentsurface, wherein the debug access port is electrically connected to theat least one microelectronic device.

In various implementations, the computing device may be a laptop, anetbook, a notebook, an ultrabook, a smartphone, a tablet, a personaldigital assistant (PDA), an ultra mobile PC, a mobile phone, a desktopcomputer, a server, a printer, a scanner, a monitor, a set-top box, anentertainment control unit, a digital camera, a portable music player,or a digital video recorder. In further implementations, the computingdevice may be any other electronic device that processes data.

It is understood that the subject matter of the present description isnot necessarily limited to specific applications illustrated in FIGS.1-6. The subject matter may be applied to other microelectronic devicesand assembly applications, as well as any appropriate electronicapplication, as will be understood to those skilled in the art.

The following examples pertain to further embodiments, wherein Example 1is a method of fabricating a microelectronic package, comprising amicroelectronic interposer having a first surface, an opposing secondsurface, and at least one side extending between the first surface andthe second surface; at least one microelectronic device attached to themicroelectronic interposer first surface; an encapsulation materialdisposed over the at least one microelectronic device and themicroelectronic interposer, wherein the encapsulation material includesat least one side which is substantially planar to the at least onemicroelectronic interposer side and wherein the at least oneencapsulation material side and the at least one microelectronicinterposer side comprise a microelectronic package side; and at leastone debug access port formed proximate the least one of themicroelectronic package side and the microelectronic interposer secondsurface, wherein the debug access port is electrically connected to theat least one microelectronic device.

In Example 2, the subject matter of Example 1 can optionally include theat least one debug access port being formed at the microelectronicinterposer first surface.

In Example 3, the subject matter of Example 2 can optionally include theat least one debug access port comprising a debug trace formed on or inthe microelectronic interposer first surface and a solder bump formed onthe debug trace.

In Example 4, the subject matter of Example 1 can optionally include theat least one debug access port comprising at least one debug traceformed within the microelectronic interposer.

In Example 5, the subject matter of Example 4 can optionally include theat least one debug trace comprising a plurality of debug traces in astacked configuration relative to the microelectronic interposer firstsurface and the microelectronic interposer second surface.

In Example 6, the subject matter of Example 4 can optionally include theat least on debug access port comprising at least one probe contactproximate the microelectronic interposer side and electrically connectedto the at least one debug trace.

In Example 7, the subject matter of Example 1 can optionally include theat least one debug access port comprising at least one debug traceformed in or on the microelectronic interposer second surface.

In Example 8, the subject matter of Example 7 can optionally include theat least one debug access port further including at least one solderbump formed on the at least one debug trace.

The following examples pertain to further embodiments, wherein Example 9is a method of fabricating a microelectronic package, comprising forminga microelectronic interposer having a first surface, an opposing secondsurface, and at least one side extending between the first surface andthe second surface; attaching at least one microelectronic device to themicroelectronic interposer first surface; disposing an encapsulationmaterial over the at least one microelectronic device and themicroelectronic interposer, wherein the encapsulation material includesat least one side which is substantially planar to at the least onemicroelectronic interposer side and wherein the at least oneencapsulation material side and the at least one microelectronicinterposer side comprise a microelectronic package side; and forming atleast one debug access port proximate the least one of themicroelectronic package side and the microelectronic interposer secondsurface, wherein the debug access port is electrically connected to theat least one microelectronic device.

In Example 10, the subject matter of Example 9 can optionally includeforming the at least one debug access port comprising forming the atleast one debug access port at the microelectronic interposer firstsurface.

In Example 11, the subject matter of Example 10 can optionally includeforming the at least one debug access port comprising forming a debugtrace on or in the microelectronic interposer first surface and forminga solder bump on the debug trace.

In Example 12, the subject matter of Example 11 can optionally includeforming the debug trace on or in the microelectronic interposer firstsurface and forming the solder bump on the debug trace furthercomprising forming a portion of the debug trace and the solder bumpwithin a dicing street, and forming the microelectronic package side bycutting through the encapsulation material and the microelectronicinterposer within the dicing street, which removes portion of the debugtrace and the solder bump within the dicing street.

In Example 13, the subject matter of Example 9 can optionally includeforming the at least one debug access port comprising forming at leastone debug trace within the microelectronic interposer.

In Example 14, the subject matter of Example 13 can optionally includeforming the at least one debug trace comprising forming a plurality ofdebug traces in a stacked configuration relative to the microelectronicinterposer first surface and the microelectronic interposer secondsurface.

In Example 15, the subject matter of Example 13 can optionally includeforming the at least on debug access port comprising forming at leastone probe contact proximate the microelectronic interposer side andelectrically connected to the at least one debug trace.

In Example 16, the subject matter of Example 9 can optionally includeforming the at least one debug access port comprising forming at leastone debug trace in or on the microelectronic interposer second surface.

In Example 17, the subject matter of one of Examples 16 can optionallyinclude forming the at least one debug access port further includingforming at least one solder bump on the at least one debug trace.

The following examples pertain to further embodiments, wherein Example18 is an electronic system comprising a microelectronic substrate, and amicroelectronic package attached to the microelectronic substrate,wherein the microelectronic package comprises a microelectronicinterposer having a first surface, an opposing second surface, and atleast one side extending between the first surface and the secondsurface; at least one microelectronic device attached to themicroelectronic interposer first surface; an encapsulation materialdisposed over the at least one microelectronic device and themicroelectronic interposer, wherein the encapsulation material includesat least one side which is substantially planar to the at least onemicroelectronic interposer side and wherein the at least oneencapsulation material side and the at least one microelectronicinterposer side comprise a microelectronic package side; and at leastone debug access port formed proximate the least one of themicroelectronic package side and the microelectronic interposer secondsurface, wherein the debug access port is electrically connected to theat least one microelectronic device.

In Example 19, the subject matter of Example 18 can optionally includethe at least one debug access port being formed at the microelectronicinterposer first surface.

In Example 20, the subject matter of Example 19 can optionally includethe at least one debug access port comprising a debug trace formed on orin the microelectronic interposer first surface and a solder bump formedon the debug trace.

In Example 21, the subject matter of Example 18 can optionally includethe at least one debug access port comprising at least one debug traceformed within the microelectronic interposer.

In Example 22, the subject matter of Example 21 can optionally includethe at least one debug trace comprising a plurality of debug traces in astacked configuration relative to the microelectronic interposer firstsurface and the microelectronic interposer second surface.

In Example 23, the subject matter of Example 21 can optionally includethe at least on debug access port comprising at least one probe contactproximate the microelectronic interposer side and electrically connectedto the at least one debug trace.

In Example 24, the subject matter of Example 18 can optionally includethe at least one debug access port comprising at least one debug traceformed in or on the microelectronic interposer second surface.

In Example 25, the subject matter of Example 24 can optionally includethe at least one debug access port further including at least one solderbump formed on the at least one debug trace.

Having thus described in detail embodiments of the present description,it is understood that the present description defined by the appendedclaims is not to be limited by particular details set forth in the abovedescription, as many apparent variations thereof are possible withoutdeparting from the spirit or scope thereof.

What is claimed is:
 1. A microelectronic package, comprising: amicroelectronic interposer having a first surface, an opposing secondsurface, and at least one side extending between the first surface andthe second surface; at least one microelectronic device attached to themicroelectronic interposer first surface; an encapsulation materialdisposed over the at least one microelectronic device and themicroelectronic interposer, wherein the encapsulation material includesat least one side which is substantially planar to the at least onemicroelectronic interposer side and wherein the at least oneencapsulation material side and the at least one microelectronicinterposer side comprise a microelectronic package side; and at leastone exposed debug access port formed proximate the least one of themicroelectronic package side and the microelectronic interposer secondsurface, wherein the exposed debug access port is electrically connectedto the at least one microelectronic device.
 2. The microelectronicpackage of claim 1, wherein the at least one exposed debug access portis formed at the microelectronic interposer first surface.
 3. Themicroelectronic package of claim 1, wherein the at least one exposeddebug access port comprises at least one exposed debug trace formedwithin the microelectronic interposer.
 4. The microelectronic package ofclaim 3, wherein the at least one exposed debug trace comprises aplurality of exposed debug traces in a stacked configuration relative tothe microelectronic interposer first surface and the microelectronicinterposer second surface.
 5. The microelectronic package of claim 3,wherein the at least one exposed debug access port comprises at leastone probe contact on the microelectronic interposer side andelectrically connected to the at least one exposed debug trace.
 6. Themicroelectronic package of claim 1, wherein the at least one exposeddebug access port comprises at least one exposed debug trace formed inor on the microelectronic interposer second surface.
 7. An electronicsystem, comprising a microelectronic substrate; and a microelectronicpackage attached to the microelectronic substrate, wherein themicroelectronic package comprises: a microelectronic interposer having afirst surface, an opposing second surface, and at least one sideextending between the first surface and the second surface; at least onemicroelectronic device attached to the microelectronic interposer firstsurface; an encapsulation material disposed over the at least onemicroelectronic device and the microelectronic interposer, wherein theencapsulation material includes at least one side which is substantiallyplanar to the at least one microelectronic interposer side and whereinthe at least one encapsulation material side and the at least onemicroelectronic interposer side comprise a microelectronic package side;and at least one exposed debug access port formed proximate the leastone of the microelectronic package side and the microelectronicinterposer second surface, wherein the exposed debug access port iselectrically connected to the at least one microelectronic device. 8.The electronic system of claim 7, wherein the at least one exposed debugaccess port is formed at the microelectronic interposer first surface.9. The electronic system of claim 7, wherein the at least one exposeddebug access port comprises at least one exposed debug trace formedwithin the microelectronic interposer.
 10. The electronic system ofclaim 9, wherein the at least one exposed debug trace comprises aplurality of exposed debug traces in a stacked configuration relative tothe microelectronic interposer first surface and the microelectronicinterposer second surface.
 11. The electronic system of claim 9, whereinthe at least en one exposed debug access port comprises at least oneprobe contact proximate the microelectronic interposer side andelectrically connected to the at least one debug trace.
 12. Theelectronic system of claim 7, wherein the at least one exposed debugaccess port comprises at least one debug trace formed in or on themicroelectronic interposer second surface.
 13. The microelectronicpackage of claim 3, wherein the at least one exposed debug trace extendsto and is exposed at the at least one side of the microelectronicinterposer.
 14. The microelectronic package of claim 6, wherein the atleast one exposed debug trace extends to and is exposed at the at leastone side of the microelectronic interposer.
 15. The electronic system ofclaim 9, wherein the at least one exposed debug trace extends to and isexposed at the at least one side of the microelectronic interposer. 16.The electronic system of claim 12, wherein the at least one exposeddebug trace extends to and is exposed at the at least one side of themicroelectronic interposer.